Facilities
Field Emission Scanning Electron Microscopy (FE-SEM)
JEOL JSM IT-800 (is) — Versatile high-resolution Scanning Electron Microscope
Specifications
| Source | In-lens Schottky Plus field emission electron gun (0.01V to 30kV) |
|---|---|
| Resolution | 0.6 nm at 15 kV 1.0 nm at 1 kV |
| Magnification | 25X to 2MX |
| Mode | High Vacuum (for conductors) Low Vacuum (for insulators) |
| Accessories available | EDS Detector (standard) Secondary electron detector (SED) Upper electron detector (UED) Upper in-lens detector (UID) |
| Objective lens | Semi in-lens |
| Specimen stage | Full eucentric goniometer stage |
| Stage control | 5-axis motor drive |
| Specimen size |
Type 1 (standard): Maximum diameter 170 mm, maximum height 45 mm (WD 5 mm) Stage movement range — X: 70 mm, Y: 50 mm, Z: 1 to 41 mm, Tilt: −5° to 70°, Rotation: 360° Type 2 (option): Maximum diameter 200 mm, maximum height 55 mm (WD 5 mm) |
Applications
- Surface analysis
- Materials evaluation
- Failure analysis
- Particle distribution
- Structural analysis & measurement of sample microscopic features
- Study of surface morphology
- Characterization of coatings
- Integrated circuit evaluation
- Study of microstructures
- Fracture and structural defects analysis
Physics Laboratory
Computer Lab
This lab is used for Digital Design, Verilog, C++, Matlab, Microprocessor, Microcontroller, and Signal Systems labs.
Optics Lab
This lab is used for Optical System Design and Basic Optics.
Material Science Lab
Mechanics and Wave Oscillation Lab
Electronics Lab
Electricity Lab
Heat and Thermodynamics Lab
